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NAIST Application NoP05-63



TitleIMAGE SENSOR
INVENTORTOKUDA, Takashi; (JP).OHTA, Jun; (JP).
Pub.NoWO/2007/129451Pub Date15.11.2007
International Application NoPCT/JP2007/000401International Application Date 12.04.2007

abstractA metallic wiring layer (324), i.e., the uppermost layer of the light-shielding layer is formed of a multilayer metallic wiring (32) to hinder light from entering regions of a photodiode (11) other than the light-receiving region of each pixel cell. The metallic wring layer (324) is brought into direct contact to a subject and used as a measurement electrode (15) for measuring an electric signal. A circuit for reading the electric signal produced by the measurement electrode (15) is provided in each pixel cell independently or commonly in addition to the circuit for reading the electrical signal produced by the photodiode (11). With this, in each pixel cell, the photodiode (11) for optical measurement and the measurement electrode (15) for electrical measurement are provided. The spatial resolutions of both two-dimensional images of the image sensor integrally having an optical measurement function of acquiring optical information on a subject and an electrical measurement function of acquiring electrical information on the subject can be both improved.
National PhaseEP 29.10.2008 2007737058 (Published: 07.01.2009)